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Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter
Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter
Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter
Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter
Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter
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Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter
Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter
Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter
Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter
Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter

Wholesale Keysight 7i Series E9988GL In-Line High-Density ICT System Exporters, Exporter

The E9988GL Keysight i3070 Series 7i In-Line High-Density In-Circuit Test (ICT) System delivers a premium solution for automated production line testing requirements through its innovative design and robust performance. Equipped with the latest quad-density pin cards, this system accommodates up to 5,760 test nodes within a compact footprint maintaining an 800-millimetre slim width – doubling previous node capacity. This enhanced node capacity not only provides greater resources for complex test requirements and supports larger panels, but also effectively reduces PCB handling and transfer times, significantly boosting test efficiency.

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Product Description

The 7i Series E9988GL In-Circuit Test (ICT) System stands as a cutting-edge solution tailored for modern automated production lines. It integrates high-density testing capabilities, a compact design, and versatile features to comprehensively optimize testing efficiency and resource utilization.
I. Core Design and Density Advantages
As an oscilloscope focused on fundamental and advanced testing needs, its performance parameters balance practicality and precision:
The system core employs the latest quad-density test fixture. This key innovation enables up to 5,760 test nodes—doubling traditional system capacity—while maintaining an ultra-slim 800mm width. The compact chassis design significantly reduces floor space requirements in production environments, while the expanded node capacity addresses complex testing scenarios. It not only provides ample resources for precision testing needs but also supports processing larger-sized panels, substantially reducing PCB handling and transfer times to optimize the overall testing workflow.
II. Key Performance and Functional Upgrades
The E9988GL incorporates multiple advanced features to comprehensively enhance testing capabilities across various applications:
  • Integrated Supercapacitor Testing: Built-in solutions test supercapacitors up to 100 Farads (F) without external tools, streamlining energy storage component verification.
  • Low-Current Measurement Accuracy: Achieves ultra-low current measurements down to 100 nanoamperes (nA), ensuring precision for low-power components while reducing development cycles by simplifying complex measurement setups.
  • Accelerated Short-Circuit Testing: Utilizes an enhanced short-circuit testing algorithm, boosting test speed by 50% compared to traditional methods, effectively shortening test cycles and improving overall production efficiency.
  • Enhanced Test Coverage: Automatically generates cluster tests to expand test coverage, ensuring comprehensive verification of circuit board functionality and reducing the risk of undetected defects.
  • Seamless Scalability: Built-in function ports enable effortless expansion of test capabilities, allowing users to adapt to evolving test requirements without extensive reconfiguration.
  • Overcoming Access Limitations: Integration with the x1149 boundary scan analyzer enables the system to bypass restricted test access points on the board, ensuring reliable testing even for densely packed or hard-to-reach components.
III. Investment Protection and Compatibility
A key advantage of the 7i Series E9988GL is its full backward compatibility with existing E9988E and E9988EL test programs and fixtures. This safeguards customers' current investments in test infrastructure, eliminating the costs and disruptions of redeveloping test flows or replacing compatible equipment, delivering long-term value and peace of mind.
IV. Application Value in Automated Production
By integrating advanced ICT technology into automated production lines, the 7i Series E9988GL directly addresses manufacturers' core needs: conserving valuable production resources (space, time, and cost), optimizing automated test strategies, and delivering stable, high-quality test results. Whether for complex electronic components or high-volume production environments, this system serves as a reliable foundation for efficient in-line testing.
Parameter Specification
Dimensions (excluding beacon and LCD panel) (L x W x H) 800 mm x 1,500 mm x 1,970 mm (31.5" x 59.0" x 77.6")
Number of test nodes 5,760 Maximum
PCB size (L x D) Minimum: 50 mm x 60 mm (2" x 2.4")
Maximum: 470 mm x 500 mm (18.5" x 19.7")
PCB size (With bypass option) (L x D) Minimum: 50 mm x 60 mm (2" x 2.4")
Maximum: 470 mm x 350 mm (18.5" x 13.8")
PCB thickness Minimum: 0.6 mm (0.02")
Maximum: 5 mm (0.20")
Maximum supportable PCB weight 5 kg (11 lbs)
PCB edge support (Factory configured) 3 mm (0.12") / 1.5 mm (0.06")
Component clearance Top: 90 mm (3.5"), Bottom: 30 mm (1.2")
Transport method Belt transfer
Transport Direction (User configurable) Left to right / Right to left
Transport speed Minimum: 50 mm per second (2.0" per second)
Maximum: 650 mm per second (25.6" per second)
Transport height Minimum: 900 mm (35.4")
Maximum: 980 mm (38.5")
Bottom fixture height Minimum: 75 mm (2.9")
Maximum: 105 mm (4.1")
PCB exchange times 4 to 7 seconds
Press force 20 kN
Air Pressure 500 to 700 kPa (72.5 to 101.5 psi)
Power 3-phase, DELTA; Support 200-240 VAC
3-phase, WYE; Support 208-240 VAC
3-phase, WYE with neutral; Support 220/380 - 240/415 VAC (Line-to-neutral / Line-to-line)
Supercap measurement Up to 100F (via N6700C with N6792A and N6752A)
Low current measurement Down to 100 nA (via B2912B)
Models: 7i Series E9988GL In-Line High-Density ICT System
Delivery information typically includes delivery times, shipping methods, packaging, etc., which may vary depending on the seller and the location of purchase.
Datasheet PDF Icon
7i Series E9988GL In-Line High-Density ICT System datasheet.pdf
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Frequently Asked Questions (FAQ)
What is the maximum test node capacity of the 7i Series E9988GL ICT System?
The system features a quad-density test fixture that supports up to 5,760 test nodes, effectively doubling traditional system capacity while maintaining an ultra-slim 800mm width.
What are the physical dimensions of the E9988GL system?
Excluding the beacon and LCD panel, the system dimensions are 800 mm x 1,500 mm x 1,970 mm (31.5" x 59.0" x 77.6"). Its compact design is ideal for minimizing floor space in production environments.
Can the system measure low-current and supercapacitors directly?
Yes. The system includes integrated supercapacitor testing up to 100 Farads (F) without external tools and is capable of highly accurate, ultra-low current measurements down to 100 nanoamperes (nA).
Is this system backward compatible with my older test programs?
Absolutely. The E9988GL is fully backward compatible with existing E9988E and E9988EL test programs and fixtures, preserving your current investments and preventing redevelopment costs.
How does the system handle components with restricted test access?
By integrating with the x1149 boundary scan analyzer, the system can bypass physical access limitations to accurately test densely packed or hard-to-reach components.
What is the speed improvement for short-circuit testing on this model?
The E9988GL features an enhanced short-circuit testing algorithm that increases testing speeds by 50% compared to traditional methods, reducing production cycle times.

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