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The Tektronix Keithley 4200A-SCS Parameter Analyzer is a high-precision test instrument specifically designed for characterizing semiconductor devices and materials. It is widely used in semiconductor R&D, manufacturing, and academic research, excelling particularly in the precise measurement and analysis of electrical parameters for diodes, transistors (MOSFET, BJT, IGBT), sensors, optoelectronic devices, and novel semiconductor materials (such as graphene and perovskite).
As an upgraded model in Keithley's classic parameter analyzer series, the 4200A-SCS centers on "high precision + high flexibility + ease of use." It addresses traditional testing pain points—such as complex multi-instrument setups, difficult data synchronization, and insufficient accuracy—by providing a "one-stop" solution for device characterization. Its core advantages include:
Eliminates the need for additional power supplies, multimeters, oscilloscopes, etc. A single unit integrates multiple test modules including voltage sources, current sources, nanoamp meters, picoamp meters, and capacitance meters. This enables a closed-loop "source-measure-analyze" process, minimizing signal loss and synchronization errors.
Exceptional capability for measuring weak signals (e.g., leakage current, gate current). Current measurement range extends down to 1fA (femtoampere), with voltage measurement accuracy reaching ±0.01%. Supports wide dynamic range source output (voltage up to ±210V, current up to ±100mA), meeting testing demands from basic devices to high-precision sensors.
Flexible module configurations enable functional expansion based on testing requirements—such as adding a C-V (capacitance-voltage) test module (for characterizing device dielectric properties), a pulse source module (for dynamic characteristic testing), and high/low-temperature environmental control interfaces (compatible with temperature-controlled probe stations to simulate device performance at varying temperatures), adapting to diverse application scenarios.
The core functionality of the 4200A-SCS revolves around "comprehensive electrical parameter characterization of devices," primarily covering the following test scenarios:
Performance verification of novel devices (e.g., FinFET, GAA FET) and process optimization (e.g., impact of lithography and deposition processes on device parameters).
Factory quality assurance/quality control (QA/QC) for diodes, transistors, and sensors to ensure parameter consistency.
High-voltage, high-current characterization of wide-bandgap semiconductor devices (IGBTs, SiC, GaN), suitable for new energy vehicles and photovoltaic inverters.
Electrical property characterization of graphene, 2D materials, organic semiconductors, and perovskite solar cells to advance fundamental scientific breakthroughs.
| Model | Description | Main Measurement | Range | Measurement Resolution |
|---|---|---|---|---|
| 4200 - SMU | Medium - power Source Measure Unit | DC I - V, Ultra - low Frequency C - V, Quasi - static C - V | ±100 mA, ±210 V | 0.2 μV, 100 fA |
| 4210 - SMU | High - power Source Measure Unit | DC I - V, Ultra - low Frequency C - V, Quasi - static C - V | ±1 A, ±210 V | 0.2 μV, 100 fA |
| 4200 - PA | Remote Front - end Amplifier Module | Expand the current range of all SMUs | 0.2 μV, 10 aA | - |
| 4210 - CVU | Capacitance - Voltage Unit | AC Impedance (C - V, C - f, C - t) | 1 kHz - 10 MHz, ±30 V built - in DC bias (60 V differential), can be expanded to ±210 V (420 V differential) using SMU | - |
| 4200A - CVIV | I - V/C - V Multi - channel Switch Module | Automatically switch between DC I - V and C - V measurements | - | - |
| 4225 - PMU | Ultra - fast Pulse Measurement Unit | Pulsed I - V, Segment ARB® multi - level pulse, Transient waveform capture | ±40 V (80 Vp - p), ±800 mA, 200 MSa/s simultaneously measure current and voltage | - |
| 4225 - RPM | Remote Front - end Amplifier/Switch Module | Automatically switch between DC I - V, C - V, and ultra - fast Pulsed I - V measurements | Expand the current sensitivity of 4225 - PMU to tens of picoamperes | 200 pA |
| 4220 - PGU | High - voltage Pulse Generator Unit | Pulsed voltage source, Segment ARB® multi - level pulse | ±40 V (80 Vp - p), 2048 unique segments | - |
Tektronix Keithley 4200A-SCS Parameter Analyzer Range Configurations:
* Delivery information typically includes delivery times, shipping methods, packaging, etc., which may vary depending on the seller and the location of purchase.
It is designed for the electrical characterization of semiconductor devices, materials, and processes. It measures electrical parameters for transistors, diodes, sensors, optoelectronic components, and advanced materials like graphene.
When utilizing the optional 4200-PA Remote Front-end Amplifier Module, the current measurement resolution can be expanded down to an ultra-precise level of 10 aA (attoamperes).
Yes. By using the 4210-CVU Capacitance-Voltage Unit, the analyzer can measure AC impedance, allowing C-V, C-f, and C-t profiling across a frequency range of 1 kHz to 10 MHz.
Pulsed I-V testing prevents self-heating in high-power devices like IGBTs, ensuring measurements are taken under stable thermal conditions. The 4225-PMU supports pulse widths down to 100ns.
The unit integrates with standard KickStart software for easy graphical test programming. It also supports SCPI command controls, enabling automated scripts via Python, MATLAB, and LabVIEW.
No, this parameter analyzer is designed without an internal battery. The physical unit dimensions are 223 * 436 * 565 mm, weighing approximately 29.7 kg.
